TheInterferometric Displacement Sensor (IDS)option for the Cypher AFM directly measures cantileverdeflectioninstead of cantileveranglethat is utilized in conventional optical beam detection (OBD).IDS eliminates the artifacts due to electrostatic coupling, enablingmeasurements that are more reproducible and accurate, especially for piezoresponse force microscopy (PFM) and d33 measurements. 詢價 增加到詢價列表 在詢價列表中查看此產品